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IS41LV85125B
512K x 8 (4-MBIT) DYNAMIC RAM WITH FAST PAGE MODE
FEATURES
* * * * Fast access and cycle time TTL compatible inputs and outputs Refresh Interval: 1024 cycles/16 ms Refresh Mode: RAS-Only, CAS-before-RAS (CBR), and Hidden * JEDEC standard pinout * Single power supply: 3.3V 10% * Lead-free available
ISSI
APRIL 2005
(R)
DESCRIPTION
The ISSI IS41LV85125B is 512,288 x 8-bit high-performance CMOS Dynamic Random Access Memories. Fast Page Mode allows 1024 random accesses within a single row with access cycle time as short as 12 ns per 8-bit word. These features make the IS41LV85125B ideally suited for high band-width graphics, digital signal processing, highperformance computing systems, and peripheral applications. The IS41LV85125B is available in a 28-pin, 400-mil SOJ package.
KEY TIMING PARAMETERS
Parameter Max. RAS Access Time (tRAC) Max. CAS Access Time (tCAC) Max. Column Address Access Time (tAA) Min. Fast Page Mode Cycle Time (tPC) Min. Read/Write Cycle Time (tRC) -60 60 15 30 40 110 Unit ns ns ns ns ns
PIN CONFIGURATION 28-Pin SOJ
VDD I/O0 I/O1 I/O2 I/O3 NC WE RAS A9 A0 A1 A2 A3 VDD
1 2 3 4 5 6 7 8 9 10 11 12 13 14
28 27 26 25 24 23 22 21 20 19 18 17 16 15
GND I/O7 I/O6 I/O5 I/O4 CAS OE NC A8 A7 A6 A5 A4 GND
PIN DESCRIPTIONS
A0-A9 I/O0-I/O7 WE OE RAS CAS VDD GND NC Address Inputs Data Inputs/Outputs Write Enable Output Enable Row Address Strobe Column Address Strobe Power Ground No Connection
Copyright (c) 2005 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 04/19/05
1
IS41LV85125B
FUNCTIONAL BLOCK DIAGRAM
ISSI
(R)
OE WE CAS CAS CLOCK GENERATOR WE CONTROL LOGICS OE CONTROL LOGIC OE RAS
CAS
WE
RAS
RAS CLOCK GENERATOR
DATA I/O BUS
COLUMN DECODERS SENSE AMPLIFIERS
REFRESH COUNTER
DATA I/O BUFFERS
I/O0-I/O7
ROW DECODER
ADDRESS BUFFERS A0-A9
MEMORY ARRAY 512,288 x 8
TRUTH TABLE
Function Standby Read Write: Word (Early Write) Read-Write Hidden Refresh Read Write(1) RAS-Only Refresh CBR Refresh
Notes: 1. EARLY WRITE only.
RAS H L L L LHL LHL L HL
CAS H L L L L L H L
WE X H L HL H L X X
OE X L X LH L X X X
Address tR/tC X ROW/COL ROW/COL ROW/COL ROW/COL ROW/COL ROW/NA X
I/O High-Z DOUT DIN DOUT, DIN DOUT DOUT High-Z High-Z
2
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 04/19/05
IS41LV85125B
FUNCTIONAL DESCRIPTION
The IS41LV85125B is a CMOS DRAM optimized for highspeed bandwidth, low-power applications. During READ or WRITE cycles, each bit is uniquely addressed through the 19 address bits. The first ten address bits (A0-A9) are entered as row address and latter nine address bits (A0A8) are entered as column address. The row address is latched by the Row Address Strobe (RAS). The column address is latched by the Column Address Strobe (CAS). RAS is used to latch the first ten bits of row address and CAS is used to latch the latter nine bits of column address.
ISSI
Refresh Cycle
(R)
To retain data, 1024 refresh cycles are required in each 16 ms period. There are two ways to refresh the memory: 1. By clocking each of the 1024 row addresses (A0 through A9) with RAS at least once every 16 ms. Any read, write, read-modify-write or RAS-only cycle refreshes the addressed row. 2. Using a CAS-before-RAS refresh cycle. CAS-beforeRAS refresh is activated by the falling edge of RAS, while holding CAS LOW. In CAS-before-RAS refresh cycle, an internal 10-bit counter provides the row addresses and the external address inputs are ignored. CAS-before-RAS is a refresh-only mode and no data access or device selection is allowed. Thus, the output remains in the High-Z state during the cycle.
Memory Cycle
A memory cycle is initiated by bringing RAS LOW and it is terminated by returning both RAS and CAS HIGH. To ensure proper device operation and data integrity any memory cycle, once initiated, must not be ended or aborted before the minimum tRAS time has expired. A new cycle must not be initiated until the minimum precharge time tRP, tCP has elapsed.
Power-On
After application of the VDD supply, an initial pause of 200 s is required followed by a minimum of eight initialization cycles (any combination of cycles containing a RAS signal). During power-on, it is recommended that RAS track with VDD or be held at a valid VIH to avoid current surges.
Read Cycle
A read cycle is initiated by the falling edge of CAS or OE, whichever occurs last, while holding WE HIGH. The column address must be held for a minimum time specified by tAR. Data Out becomes valid only when tRAC, tAA, tCAC and tOEA are all satisfied. As a result, the access time is dependent on the timing relationships between these parameters.
Write Cycle
A write cycle is initiated by the falling edge of CAS and WE, whichever occurs last. The input data must be valid at or before the falling edge of CAS or WE, whichever occurs last.
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 04/19/05
3
IS41LV85125B
ABSOLUTE MAXIMUM RATINGS(1)
Symbol VT VDD IOUT PD TA TSTG Parameters Voltage on Any Pin Relative to GND 3.3V Supply Voltage 3.3V Output Current Power Dissipation Operation Temperature Com. Storage Temperature Rating -0.5 t0 +4.6 -0.5 t0 +4.6 50 1 0 to +70 -55 to +125 Unit V V mA W C C
ISSI
(R)
Note: 1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
RECOMMENDED OPERATING CONDITIONS (Voltages are referenced to GND)
Symbol VDD VIH VIL TA Parameter Supply Voltage Input High Voltage Input Low Voltage Ambient Temperature Voltage 3.3V 3.3V 3.3 Com. Min. 3.0 2.0 -0.3 0 Typ. 3.3 -- -- -- Max. 3.6 VDD + 0.3 0.8 +70 Unit V V V C
CAPACITANCE(1,2)
Symbol CIN1 CIN2 CIO Parameter Input Capacitance: A0-A9 Input Capacitance: RAS, UCAS, LCAS, WE, OE Data Input/Output Capacitance: I/O0-I/O7 Max. 5 7 7 Unit pF pF pF
Notes: 1. Tested initially and after any design or process changes that may affect these parameters. 2. Test conditions: TA = 25C, f = 1 MHz.
4
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 04/19/05
IS41LV85125B
ISSI
Test Condition Any input 0V VIN VDD Other inputs not under test = 0V Output is disabled (Hi-Z) 0V VOUT VDD IOH = -2 mA IOL = 2 mA RAS, CAS VIH 3.3V RAS, CAS VDD - 0.2V 3.3V RAS, CAS, Address Cycling, tRC = tRC (min.) RAS = VIL, CAS, Cycling tPC = tPC (min.) RAS Cycling, CAS VIH tRC = tRC (min.) RAS, CAS Cycling tRC = tRC (min.) Com. -60 Speed Min. -10 -10 2.4 -- -- -- -- Max. 10 10 -- 0.4 2 2 170 A A V V mA mA mA
(R)
ELECTRICAL CHARACTERISTICS(1) (Recommended Operation Conditions unless otherwise noted.)
Symbol IIL IIO VOH VOL ICC1 ICC2 ICC3 Parameter Input Leakage Current Output Leakage Current Output High Voltage Level Output Low Voltage Level Stand-by Current: TTL Stand-by Current: CMOS Operating Current: Random Read/Write(2,3,4) Average Power Supply Current Operating Current: Fast Page Mode(2,3,4) Average Power Supply Current Refresh Current: RAS-Only(2,3) Average Power Supply Current Refresh Current: CBR(2,3,5) Average Power Supply Current Unit
ICC4
-60
--
170
mA
ICC5
-60
--
170
mA
ICC6
-60
--
170
mA
Notes: 1. An initial pause of 200 s is required after power-up followed by eight RAS refresh cycles (RAS-Only or CBR) before proper device operation is assured.The eight RAS cycles wake-up should be repeated any time the tREF refresh requirement is exceeded. 2. Dependent on cycle rates. 3. Specified values are obtained with minimum cycle time and the output open. 4. Column-address is changed once each fast page cycle. 5. Enables on-chip refresh and address counters.
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 04/19/05
5
IS41LV85125B
AC CHARACTERISTICS(1,2,3,4,5,6) (Recommended Operating Conditions unless otherwise noted.)
-60 Symbol tRC tRAC tCAC tAA tRAS tRP tCAS tCP tCSH tRCD tASR tRAH tASC tCAH tAR tRAD tRAL tRPC tRSH tCLZ tCRP tOD tOE tOEHC tOEP tOES tRCS tRRH tRCH tWCH tWCR Parameter Random READ or WRITE Cycle Time Access Time from RAS(6, 7) Access Time from CAS(6, 8, 15) Access Time from Column-Address(6) RAS Pulse Width RAS Precharge Time CAS Pulse Width(26) CAS Precharge Time(9, 25) CAS Hold Time (21) RAS to CAS Delay Time(10, 20) Row-Address Setup Time Row-Address Hold Time Column-Address Setup Time(20) Column-Address Hold Time(20) Column-Address Hold Time (referenced to RAS) RAS to Column-Address Delay Time(11) Column-Address to RAS Lead Time RAS to CAS Precharge Time RAS Hold Time(27) CAS to Output in Low-Z(15, 29) CAS to RAS Precharge Time(21) Output Disable Time(19, 28, 29) Output Enable Time(15, 16) OE HIGH Hold Time from CAS HIGH OE HIGH Pulse Width OE LOW to CAS HIGH Setup Time Read Command Setup Time(17, 20) Read Command Hold Time (referenced to RAS)(12) Read Command Hold Time (referenced to CAS)(12, 17, 21) Write Command Hold Time(17, 27) Write Command Hold Time (referenced to RAS)(17) Min. 110 -- -- -- 60 40 10 10 60 20 0 10 0 10 40 15 30 5 15 0 5 3 -- 15 10 5 0 0 0 10 50 Max. -- 60 15 30 10K -- 10K -- -- 45 -- -- -- -- -- 30 -- -- 10K -- -- 15 15 -- -- -- -- -- -- -- --
ISSI
Units ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns
(R)
(Continued)
6
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 04/19/05
IS41LV85125B
AC CHARACTERISTICS(1,2,3,4,5,6) (Recommended Operating Conditions unless otherwise noted.)
-60 Symbol tWP tWPZ tRWL tCWL tWCS tDHR tACH tOEH tDS tDH tRWC tRWD tCWD tAWD tPC tRASP tCPA tPRWC tOFF tWHZ tCLCH tCSR tCHR tORD tREF tT Parameter Write Command Pulse Width(17) WE Pulse Widths to Disable Outputs Write Command to RAS Lead Time(17) Write Command to CAS Lead Time(17, 21) Write Command Setup Time(14, 17, 20) Data-in Hold Time (referenced to RAS) Column-Address Setup Time to CAS Precharge during WRITE Cycle OE Hold Time from WE during READ-MODIFY-WRITE cycle(18) Data-In Setup Time(15, 22) Data-In Hold Time(15, 22) READ-MODIFY-WRITE Cycle Time RAS to WE Delay Time during READ-MODIFY-WRITE Cycle(14) CAS to WE Delay Time(14, 20) Column-Address to WE Delay Time(14) Fast Page Mode READ or WRITE Cycle Time(24) RAS Pulse Width Access Time from CAS Precharge(15) READ-WRITE Cycle Time(24) Output Buffer Turn-Off Delay from CAS or RAS(13,15,19, 29) Output Disable Delay from WE Last CAS going LOW to First CAS returning HIGH(23) CAS Setup Time (CBR REFRESH)(30, 20) CAS Hold Time (CBR REFRESH)(30, 21) OE Setup Time prior to RAS during HIDDEN REFRESH Cycle Refresh Period (1024 Cycles) Transition Time (Rise or Fall)(2, 3) Min. 10 10 15 15 0 40 15 15 0 15 155 85 40 55 40 60 -- 56 3 3 10 5 10 0 -- 3 Max. -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- 100K 35 -- 15 15 -- -- -- -- 16 50
ISSI
Units ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ms ns
(R)
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 04/19/05
7
IS41LV85125B
ISSI
(R)
Notes: 1. An initial pause of 200 s is required after power-up followed by eight RAS refresh cycle (RAS-Only or CBR) before proper device operation is assured. The eight RAS cycles wake-up should be repeated any time the tREF refresh requirement is exceeded. 2. VIH (MIN) and VIL (MAX) are reference levels for measuring timing of input signals. Transition times, are measured between VIH and VIL (or between VIL and VIH) and assume to be 1 ns for all inputs. 3. In addition to meeting the transition rate specification, all input signals must transit between VIH and VIL (or between VIL and VIH) in a monotonic manner. 4. If CAS and RAS = VIH, data output is High-Z. 5. If CAS = VIL, data output may contain data from the last valid READ cycle. 6. Measured with a load equivalent to one TTL gate and 50 pF. 7. Assumes that tRCD < tRCD (MAX). If tRCD is greater than the maximum recommended value shown in this table, tRAC will increase by the amount that tRCD exceeds the value shown. 8. Assumes that tRCD tRCD (MAX). 9. If CAS is LOW at the falling edge of RAS, data out will be maintained from the previous cycle. To initiate a new cycle and clear the data output buffer, CAS and RAS must be pulsed for tCP. 10. Operation with the tRCD (MAX) limit ensures that tRAC (MAX) can be met. tRCD (MAX) is specified as a reference point only; if tRCD is greater than the specified tRCD (MAX) limit, access time is controlled exclusively by tCAC. 11. Operation within the tRAD (MAX) limit ensures that tRCD (MAX) can be met. tRAD (MAX) is specified as a reference point only; if tRAD is greater than the specified tRAD (MAX) limit, access time is controlled exclusively by tAA. 12. Either tRCH or tRRH must be satisfied for a READ cycle. 13. tOFF (MAX) defines the time at which the output achieves the open circuit condition; it is not a reference to VOH or VOL. 14. tWCS, tRWD, tAWD and tCWD are restrictive operating parameters in LATE WRITE and READ-MODIFY-WRITE cycle only. If tWCS tWCS (MIN), the cycle is an EARLY WRITE cycle and the data output will remain open circuit throughout the entire cycle. If tRWD tRWD (MIN), tAWD tAWD (MIN) and tCWD tCWD (MIN), the cycle is a READ-WRITE cycle and the data output will contain data read from the selected cell. If neither of the above conditions is met, the state of I/O (at access time and until CAS and RAS or OE go back to VIH) is indeterminate. OE held HIGH and WE taken LOW after CAS goes LOW result in a LATE WRITE (OE-controlled) cycle. 15. Output parameter (I/O) is referenced to corresponding CAS input, I/O0-I/O7 by LCAS and I/O8-I/O15 by UCAS. 16. During a READ cycle, if OE is LOW then taken HIGH before CAS goes HIGH, I/O goes open. If OE is tied permanently LOW, a LATE WRITE or READ-MODIFY-WRITE is not possible. 17. Write command is defined as WE going low. 18. LATE WRITE and READ-MODIFY-WRITE cycles must have both tOD and tOEH met (OE HIGH during WRITE cycle) in order to ensure that the output buffers will be open during the WRITE cycle. The I/Os will provide the previously written data if CAS remains LOW and OE is taken back to LOW after tOEH is met. 19. The I/Os are in open during READ cycles once tOD or tOFF occur. 20. The first CAS edge to transition LOW. 21. The last CAS edge to transition HIGH. 22. These parameters are referenced to CAS leading edge in EARLY WRITE cycles and WE leading edge in LATE WRITE or READMODIFY-WRITE cycles. 23. Last falling CAS edge to first rising CAS edge. 24. Last rising CAS edge to next cycle's last rising CAS edge. 25. Last rising CAS edge to first falling CAS edge. 26. Each CAS must meet minimum pulse width. 27. Last CAS to go LOW. 28. I/Os controlled, regardless UCAS and LCAS. 29. The 3 ns minimum is a parameter guaranteed by design. 30. Enables on-chip refresh and address counters.
8
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 04/19/05
IS41LV85125B
AC WAVEFORMS FAST-PAGE-MODE READ CYCLE
tRC tRAS tRP
ISSI
(R)
RAS
tCSH tCRP tRCD tRSH tCAS tCLCH tRRH
CAS
tAR tASR tRAD tRAH tRAL tASC tCAH
ADDRESS WE
Row
tRCS
Column
tRCH
Row
tAA tRAC tCAC tCLC
tOFF(1)
I/O OE
Open
tOE
Valid Data
tOD
Open
tOES
Don't Care
Note: 1. tOFF is referenced from rising edge of CAS.
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 04/19/05
9
IS41LV85125B
FAST PAGE MODE READ-MODIFY-WRITE CYCLE
ISSI
tRASP tRP
(R)
RAS
tCSH tCAS tCRP tRCD tCP tPRWC tCAS tCP tRSH tCAS tCRP
CAS
tAR tRAH tASR tRAD tASC tCAH tCPWD tASC tAR tCWL tRWD tAWD tCWD tCAH tCPWD tRAL tCAH tASC
ADDRESS
Row
Column
Column
tCWL tAWD tCWD
Column
tCWL tRWL tWP tAWD tCWD
tRCS
tWP
tWP
WE
tAA tCAC tCAC tOEA tOEA tAA tCAC tOEA tAA
OE
tRAC tCLZ
tOEZ tOED tDH tDS tCLZ
OUT IN OUT
tOEZ tOED tDH tDS
IN
tOEZ tOED tDH tCLZ
OUT IN
tDS
I/O
Don't Care
10
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 04/19/05
IS41LV85125B
FAST-PAGE-MODE EARLY WRITE CYCLE (OE = DON'T CARE)
tRC tRAS tRP
ISSI
(R)
RAS
tCSH tCRP tRCD tRSH tCAS tCLCH
CAS
tAR tASR tRAD tRAH tASC tRAL tCAH tACH
ADDRESS
Row
Column
tCWL tRWL tWCR tWCS tWCH tWP
Row
WE
tDHR tDS tDH
I/O
Valid Data
Don't Care
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 04/19/05
11
IS41LV85125B
ISSI
tRWC tRAS tRP
(R)
FAST-PAGE-MODE READ WRITE CYCLE (LATE WRITE and READ-MODIFY-WRITE Cycles)
RAS
tCSH tCRP tRCD tRSH tCAS tCLCH
CAS
tAR tASR tRAD tRAH tRAL tASC tCAH tACH
ADDRESS
Row
tRCS
Column
tRWD tCWD tAWD
Row
tCWL tRWL tWP
WE
tAA tRAC tCAC tCLZ tDS tDH
I/O
Open
tOE
Valid DOUT
tOD
Valid DIN
Open
tOEH
OE
Don't Care
12
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 04/19/05
IS41LV85125B
FAST PAGE MODE EARLY WRITE CYCLE
tRASP
ISSI
tRP tRHCP tRSH tCAS tCP tCRP
(R)
RAS
tCSH tCAS tCRP tRCD tCP tPC tCAS
CAS
tAR tRAL tRAH tASR tRAD tASC tCAH tASC tAR tCWL tWCS tWP tWCH tWCS tWP tCAH tASC tCAH
ADDRESS
Row
Column
Column
tCWL tWCH tWCS
Column
tCWL tWCH tWP
WE
tWCR
OE
tDHR tDS tDH tDS tDH tDS tDH
I/O
Valid DIN
Valid DIN
Valid DIN
Don't Care
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 04/19/05
13
IS41LV85125B
READ CYCLE (With WE-Controlled Disable)
RAS
tCSH tCRP tRCD tCAS tCP
ISSI
(R)
CAS
tAR tASR tRAD tRAH tASC tCAH tASC
ADDRESS WE
Row
tRCS
Column
tRCH tRCS
Column
tAA tRAC tCAC tCLZ
tWHZ
tCLZ
I/O OE
Open
tOE
Valid Data
Open
tOD
Don't Care
RAS-ONLY REFRESH CYCLE (OE, WE = DON'T CARE) RAS
tRC tRAS tRP
RAS
tCRP tRPC
CAS
tASR tRAH
ADDRESS I/O
Row Open
Row
Don't Care
14
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 04/19/05
IS41LV85125B
CBR REFRESH CYCLE (Addresses; WE, OE = DON'T CARE)
ISSI
tRP tRAS tRP tRAS
(R)
RAS
tRPC tCP tCHR tCSR tRPC tCSR tCHR
CAS I/O Open
HIDDEN REFRESH CYCLE(1) (WE = HIGH; OE = LOW)
tRAS tRP tRAS
RAS
tCRP tRCD tRSH tCHR
CAS
tAR tASR tRAD tRAH tASC tRAL tCAH
ADDRESS
Row
Column
tAA tRAC tCAC tCLZ tOFF(2)
I/O
Open
tOE tORD
Valid Data
Open
tOD
OE
Don't Care
Notes: 1. A Hidden Refresh may also be performed after a Write Cycle. In this case, WE = LOW and OE = HIGH. 2. tOFF is referenced from rising edge of RAS or CAS, whichever occurs last.
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 04/19/05
15
IS41LV85125B
ISSI
Package 28-pin, 400-mil SOJ 28-pin, 400-mil SOJ, Lead-free
(R)
ORDERING INFORMATION: IS41LV85125B Commercial Range: 0oC to +70oC
Speed (ns) 60 Order Part No. IS41LV85125B-60K IS41LV85125B-60KL
16
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 04/19/05
PACKAGING INFORMATION
400-mil Plastic SOJ Package Code: K
ISSI
Notes: 1. Controlling dimension: millimeters. 2. BSC = Basic lead spacing between centers. 3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the bottom of the package. 4. Reference document: JEDEC MS-027.
(R)
N
N/2+1
E1
E
1
N/2
D A
SEATING PLANE
b
C A2
e
B
A1
E2
Symbol No. Leads A A1 A2 B b C D E E1 E2 e
Millimeters Inches Min Max Min Max (N) 28 3.25 3.75 0.128 0.148 0.64 -- 0.025 -- 2.08 -- 0.082 -- 0.38 0.51 0.015 0.020 0.66 0.81 0.026 0.032 0.18 0.33 0.007 0.013 18.29 18.54 0.720 0.730 11.05 11.30 0.435 0.445 10.03 10.29 0.395 0.405 9.40 BSC 0.370 BSC 1.27 BSC 0.050 BSC
Millimeters Min Max 32 3.25 3.75 0.64 -- 2.08 -- 0.38 0.51 0.66 0.81 0.18 0.33 20.82 21.08 11.05 11.30 10.03 10.29 9.40 BSC 1.27 BSC
Inches Min Max 0.128 0.148 0.025 -- 0.082 -- 0.015 0.020 0.026 0.032 0.007 0.013 0.820 0.830 0.435 0.445 0.395 0.405 0.370 BSC 0.050 BSC
Millimeters Min Max 36 3.25 3.75 0.64 -- 2.08 -- 0.38 0.51 0.66 0.81 0.18 0.33 23.37 23.62 11.05 11.30 10.03 10.29 9.40 BSC 1.27 BSC
Inches Min Max 0.128 0.148 0.025 -- 0.082 -- 0.015 0.020 0.026 0.032 0.007 0.013 0.920 0.930 0.435 0.445 0.395 0.405 0.370 BSC 0.050 BSC
Copyright (c) 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774
Rev. F 10/29/03
PACKAGING INFORMATION
ISSI
Millimeters Min Max 42 3.25 3.75 0.64 -- 2.08 -- 0.38 0.51 0.66 0.81 0.18 0.33 27.18 27.43 11.05 11.30 10.03 10.29 9.40 BSC 1.27 BSC Inches Min Max 0.128 0.148 0.025 -- 0.082 -- 0.015 0.020 0.026 0.032 0.007 0.013 1.070 1.080 0.435 0.445 0.395 0.405 0.370 BSC 0.050 BSC Millimeters Min Max 44 3.25 3.75 0.64 -- 2.08 -- 0.38 0.51 0.66 0.81 0.18 0.33 28.45 28.70 11.05 11.30 10.03 10.29 9.40 BSC 1.27 BSC 0.128 0.148 0.025 -- 0.082 -- 0.015 0.020 0.026 0.032 0.007 0.013 1.120 1.130 0.435 0.445 0.395 0.405 0.370 BSC 0.050 BSC Inches Min Max
(R)
Millimeters Inches Symbol Min Max Min Max No. Leads (N) 40 A 3.25 3.75 0.128 0.148 A1 0.64 -- 0.025 -- A2 2.08 -- 0.082 -- B 0.38 0.51 0.015 0.020 b 0.66 0.81 0.026 0.032 C 0.18 0.33 0.007 0.013 D 25.91 26.16 1.020 1.030 E 11.05 11.30 0.435 0.445 E1 10.03 10.29 0.395 0.405 E2 9.40 BSC 0.370 BSC e 1.27 BSC 0.050 BSC
Copyright (c) 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products.
2
Integrated Silicon Solution, Inc. -- www.issi.com -- 1-800-379-4774
Rev. F 10/29/03

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